Yang Hu¹, Amit Sharma², Aleksandr Druzhinin³, Claudia Cancellieri³, Vladyslav Turlo^1,4*

1 Laboratory for Advanced Materials Processing, Empa - Swiss Federal Laboratories for Materials Science and Technology, Thun, Switzerland

2 Laboratory for Mechanics of Materials & Nanostructures, Empa - Swiss Federal Laboratories for Materials Science and Technology, Thun, Switzerland

3 Laboratory for Joining Technologies and Corrosion, Empa - Swiss Federal Laboratories for Materials Science and Technology, Duebendorf, Switzerland

4 National Centre for Computational Design and Discovery of Novel Materials MARVEL, Empa, Thun, Switzerland

* Corresponding authors emails: vladyslav.turlo@empa.ch

DOI10.24435/materialscloud:d2-jw [version v1]

Publication date: Apr 07, 2025

How to cite this record

Yang Hu, Amit Sharma, Aleksandr Druzhinin, Claudia Cancellieri, Vladyslav Turlo, Refining interface stress measurement in nanomultilayers through layer corrugation and interface roughness corrections, Materials Cloud Archive 2025.53 (2025), https://doi.org/10.24435/materialscloud:d2-jw

Description

This study introduces new models that incorporate layer corrugation and interface roughness into standard approaches for measuring interface stress in nanomultilayers (NMLs). Applied to Cu/W NMLs, these models show that ignoring such features can inflate measured interface stress by up to 0.4 J/m^2. However, corrugation and roughness alone cannot account for the extreme stresses reported, suggesting that atomic-scale phenomena (e.g., intermixing and metastable phase formation at the interfaces) dominate. These findings highlight the importance of balancing bilayer counts and thickness-to-roughness ratios for reliable stress quantification, providing a practical pathway to designing and characterizing advanced nanocomposite coatings with improved accuracy.

Materials Cloud sections using this data

Files

File name	Size	Description
Hu_Data.zip MD5md5:b52c5cb600f7fe45b05652af03bc744c	538.7 KiB	Calculations of Young's modulus and biaxial modulus of Cu/W bilayers with varying layer thickness. Readme file is provided inside.

License

Files and data are licensed under the terms of the following license: Creative Commons Attribution 4.0 International.
Metadata, except for email addresses, are licensed under the Creative Commons Attribution Share-Alike 4.0 International license.

External references

Keywords

interface stress nanomultilayers corrugations roughness model MARVEL/P1