Refining interface stress measurement in nanomultilayers through layer corrugation and interface roughness corrections

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{
  "created": "2025-04-07T12:10:38.974014+00:00", 
  "metadata": {
    "license_addendum": null, 
    "keywords": [
      "interface stress", 
      "nanomultilayers", 
      "corrugations", 
      "roughness", 
      "model", 
      "MARVEL/P1"
    ], 
    "is_last": true, 
    "title": "Refining interface stress measurement in nanomultilayers through layer corrugation and interface roughness corrections", 
    "conceptrecid": "2626", 
    "edited_by": 576, 
    "contributors": [
      {
        "familyname": "Hu", 
        "affiliations": [
          "Laboratory for Advanced Materials Processing, Empa - Swiss Federal Laboratories for Materials Science and Technology, Thun, Switzerland"
        ], 
        "givennames": "Yang"
      }, 
      {
        "familyname": "Sharma", 
        "affiliations": [
          "Laboratory for Mechanics of Materials & Nanostructures, Empa - Swiss Federal Laboratories for Materials Science and Technology, Thun, Switzerland"
        ], 
        "givennames": "Amit"
      }, 
      {
        "familyname": "Druzhinin", 
        "affiliations": [
          "Laboratory for Joining Technologies and Corrosion, Empa - Swiss Federal Laboratories for Materials Science and Technology, Duebendorf, Switzerland"
        ], 
        "givennames": "Aleksandr"
      }, 
      {
        "familyname": "Cancellieri", 
        "affiliations": [
          "Laboratory for Joining Technologies and Corrosion, Empa - Swiss Federal Laboratories for Materials Science and Technology, Duebendorf, Switzerland"
        ], 
        "givennames": "Claudia"
      }, 
      {
        "email": "vladyslav.turlo@empa.ch", 
        "familyname": "Turlo", 
        "affiliations": [
          "Laboratory for Advanced Materials Processing, Empa - Swiss Federal Laboratories for Materials Science and Technology, Thun, Switzerland", 
          "National Centre for Computational Design and Discovery of Novel Materials MARVEL, Empa, Thun, Switzerland"
        ], 
        "givennames": "Vladyslav"
      }
    ], 
    "references": [
      {
        "citation": "Y. Hu, A. Sharma, A. Druzhinin, C. Cancellieri, V. Turlo, arXiv:2501.18247 (2025)", 
        "doi": "10.48550/arXiv.2501.18247", 
        "comment": "Preprint where the data is discussed", 
        "type": "Preprint", 
        "url": "https://arxiv.org/abs/2501.18247v1"
      }
    ], 
    "license": "Creative Commons Attribution 4.0 International", 
    "_oai": {
      "id": "oai:materialscloud.org:2627"
    }, 
    "status": "published", 
    "doi": "10.24435/materialscloud:d2-jw", 
    "owner": 969, 
    "id": "2627", 
    "publication_date": "Apr 07, 2025, 17:37:22", 
    "description": "This study introduces new models that incorporate layer corrugation and interface roughness into standard approaches for measuring interface stress in nanomultilayers (NMLs). Applied to Cu/W NMLs, these models show that ignoring such features can inflate measured interface stress by up to 0.4 J/m^2. However, corrugation and roughness alone cannot account for the extreme stresses reported, suggesting that atomic-scale phenomena (e.g., intermixing and metastable phase formation at the interfaces) dominate. These findings highlight the importance of balancing bilayer counts and thickness-to-roughness ratios for reliable stress quantification, providing a practical pathway to designing and characterizing advanced nanocomposite coatings with improved accuracy.", 
    "mcid": "2025.53", 
    "version": 1, 
    "_files": [
      {
        "size": 551627, 
        "description": "Calculations of Young's modulus and biaxial modulus of Cu/W bilayers with varying layer thickness. Readme file is provided inside.", 
        "key": "Hu_Data.zip", 
        "checksum": "md5:b52c5cb600f7fe45b05652af03bc744c"
      }
    ]
  }, 
  "updated": "2025-04-07T15:37:23.031024+00:00", 
  "id": "2627", 
  "revision": 2
}